S29GL512S10TFI023 | Cypress Semiconductor

S29GL512S10TFI023
Status: In Production

Datasheet

(pdf, 2.33 MB) RoHS PB Free

S29GL512S10TFI023

Automotive QualifiedN
Density (Mbit)512
Initial Access Time (ns)100
InterfaceParallel
Interface Frequency (SDR / DDR) (MHz)NA
Max. Operating Temp. (°C)85
Max. Operating Voltage (V)3.60
Min. Operating Temp. (°C)-40
Min. Operating Voltage (V)2.70
Operating Voltage (V)3
Page Access Time (ns)15
Part FamilyParallel NOR
SeriesGL-S
Tape & ReelY
Temperature Range (Min C to Max C)-40C to +85C

Pricing & Inventory Availability

1-9 unit Price* 10-24 unit Price* 25-99 unit Price* 100-249 unit Price* 250-999 unit Price* 1000+ unit Price*
$9.24 $7.77 $6.93 $6.09 $5.75 $5.38
Availability Quantity Ships In Buy from Cypress Buy from Distributors
Out of Stock 0 Please click here to check lead times

Packaging/Ordering

No. of Pins
56
Package Cross Section Drawing
Package Carrier
REEL
Package Carrier Drawing / Orientation
Standard Pack Quantity
1
Minimum Order Quantity (MOQ)
1000
Order Increment
1000
Estimated Lead Time (days)
49
HTS Code
8542.32.0051
ECCN Suball
3A991.B.1.A

Quality and RoHS

Moisture Sensitivity Level (MSL)
3
Peak Reflow Temp. (°C)
PB Free
Y
Lead/Ball Finish
Matte Tin Plating

Device Qualification Reports

FIT/MTBF, ESD (HBM/CDM) and Latch-up data available in the Device Qualification Report.

Last Update: May 16, 2017

Technical Documents

Application Notes (25)

Product Change Notice (PCN) (1)

Apr 23, 2020
Addendum to PCN#165004: Introduction of Die Overcoat for Automotive NOR Flash Memory Products

Advanced Product Change Notice (APCN) (9)

Apr 23, 2020
Addendum to APCN181801 - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
Apr 14, 2020
Q419 Horizon Report Update
Apr 14, 2020
Q419 Automotive Horizon Report Update
Apr 14, 2020
Q319 Horizon Report Update
Apr 14, 2020
Q319 Automotive Horizon Report Update
Apr 14, 2020
2019 Horizon Report: Q2 Update
Apr 14, 2020
2019 Automotive Horizon Report: Q2 Update
Apr 14, 2020
Addendum to Advance PCN181801A - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
Apr 14, 2020
2019 Annual Automotive Horizon Report