Improving DAC Integral Nonlinearity (INL) Through Gain Correction | Cypress Semiconductor
Improving DAC Integral Nonlinearity (INL) Through Gain Correction
The static absolute accuracy of a Digital-to-Analog converter (DAC) can be described in terms of three fundamental kinds of errors: offset, gain error, and nonlinearity. Linearity errors are the most challenging to handle of the three since, in many applications, the user can null out the offset and gain errors or compensate for them by building end-point auto calibration into the system design. Linearity errors, however, require more complex correction.