AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | Cypress Semiconductor
AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates
Last Updated:
May 28, 2020
Version:
*D
This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life¿ MoBL®SRAM, and Nonvolatile SRAM (nvSRAM).
This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.
Translated documents are for reference only. We recommend that you refer to the English-language version of a document if you are engaged in development of a design.
Related Files
File Title | Language | Size | Last Updated |
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English | 464.83 KB | 05/26/2020 |
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Chinese | 546.05 KB | 08/20/2015 |
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Japanese | 645.79 KB | 08/20/2015 |
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