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NoBL SRAM CY7C1370DV25 JTAG test | Cypress Semiconductor

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NoBL SRAM CY7C1370DV25 JTAG test

Last Updated: June 18, 2011

The NoBL SRAM CY7C1370DV25 issue list indicates that the part does not support boundary scan. Can I still run the boundary scan / JTAG test on a system which has this memory?


For the CY7C1370DV25 device, the JTAG instruction "EXTEST" fails, therefore, it is not possible to run the JTAG instructions that access the Boundary scan register.  However, it is possible to perform the IDCODE and BYPASS instructions in JTAG successfully for this device. Hence the JTAG test in the system can be performed by bypassing the CY7C1370DV25 device in the boundary scan chain.



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