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ESD issue in enCoRe II devices | Cypress Semiconductor

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ESD issue in enCoRe II devices

Last Updated: January 01, 2012

When we use the Zener on D+ and D- and between the GND and PWR planes we get corruption on the D+/D- lines in the enCoRe II device. The device is subjected to 4kV of ESD. How to limit this effect?


The connection between the signal ground and ground shield may give rise to a problem if they are shorted directly because the part CY7C63723 will only see the 4KV and will result in failed ESD. You may use a RC or LC combination normally to avoid this problem.



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