CSD Rawcounts variation with Temperature changes for CY8C21x34 | Cypress Semiconductor
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CSD Rawcounts variation with Temperature changes for CY8C21x34
What is the effect of Temperature on Raw counts on the CSD user module in CY8C21x34 device?
The following plots show the Raw Counts dependence on Temperature with different scanning speeds and Reference settings for the CY8C21x34 devices.
Raw Count Dependence on Temperature at Different Scanning Speeds, Reference ASE11
Test conditions: 12-bit resolution, power supply voltage 5.0V.