Cypress can offer a wide variety of tools and associated processes, including 65nm node capabilities.
MASK |
193nm litho |
ASML XT:1250 Sokudo RF3
/1100 200W |
248nm litho |
ASML /850, /750, /300 |
365 nm litho |
ASML /400, /250, /100 |
CD-SEM |
AMAT VeraSem, Verity |
Registration |
KLAT Archer AIM, 5300, 5200 |
Stabilization |
Fusion 200 PCU |
Polyimide |
8.5µm Photo-imageable |
Reticle Handling |
DMS with automated particle/pellicle damage detection and blow-off |
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ETCH |
Oxide / Nitride Etch |
AMAT Centura SuperE, EMAX, MxP |
Poly / Silicon Etch |
AMAT DPS II, LAM 9400
4400 SE2 TCP |
Metal Etch |
LAM 2300 Versys, LAM 9600 |
Wet Cleans |
Akrion Gama wet benches
Semitool SST w/EKC265, SEZ DaVinci, SEZ 223 backside cleans |
Ash / Dry Strip |
Novellus/Gasonics PEP 3010, Novellus Iridia, Mattson Aspen |
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FILMS |
PECVD |
Novellus C1 Nitride, Oxide, BPSG C2 TEOS, HDP for trench and PSG |
LPCVD |
Aviza VTR Poly, Nitride
AVP BTBAS 560C Nitride, ONO |
Atmospheric |
VTR for Oxide, Alloy, Passivation, AVP for Selective Oxidation |
Wet Cleans |
DNS FC821 Immersion bench
FSI Mercury Spray Processor |
Metrology |
KLAT ASET-F5X, Quantox, Optiprobe |
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METALS – IMPLANT – RTA – CMP |
Metals |
AMAT Endura AI, TiW, COTI, TiN (ESC & IMP), W/WN
Novellus C2 Altus W PNL |
IMPLANT |
Axcelis 8200, 8250: 10–250keV, ESC/e-shower, 0-60deg tilt
Axcelis GSD Ultra: 2-180keV, high dose, 0-11deg tilt |
RTA |
AG8108 & 8800i 675C-1100C, AMAT Centura RTP Spike Annealer |
CMP |
Westech472 for Oxide, W plug
W Dual Damascene |
CMP Cleans |
LAM/Ontrak DSS-200 Scrubber |
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DEFECT & METROLOGY |
Bare Wafer |
KLAT SP1 80nm |
Brightfield |
KLAT 2365 60nm , 2139 100nm |
Darkfield |
KLAT AIT, AIT XP Fusion |
Voltage Contrast |
KLAT eS25 |
SEM Review |
KLAT eV300-ADC & EDX |
Data Analysis |
Synopsys Odyssey |
Metrology |
DI 9000M AFM, QS-2200 FTIR, CV, film stress, 4-point probe |
|
Sort / Test Tools
SORT/TEST |
Memory Test |
Verigy 3308/4108, Advantest 5365 |
Logic Test |
Credence DUO, LT, Verigy 93000 |
Fuse / Repair |
GSI M325 Laser |
Clock Test, Burn-in |
Cypress OSC50, LCT |
Visual QA |
Camtek Falcon 200 |
|
Failure Analysis Tools
FAILURE ANALYSIS |
Imaging |
FEI DualBeam 835 FIB/SEM w/EDX
Hitachi S-4800 w/ T-E detector |
TEM |
Hitachi TEM 300kV W/EDX |
Nanoprobe |
Zyvex-100 Hitachi S4500 |
Other Imaging |
Phemos OBIRCH
Acoustic Microscope |
Sample Prep |
Microcleave, TEM sample prep, Deprocessor, Precision Polisher |
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