AN96475 - Design Considerations for Electrical Fast Transient Immunity of a CapSense® System | Cypress Semiconductor
AN96475 - Design Considerations for Electrical Fast Transient Immunity of a CapSense® System
May 18, 2016
AN96475 describes best practices for improving the electrical fast transient (EFT) immunity of a CapSense system. This application note discusses failures that can occur in a CapSense system during an EFT test and recommends measures that can improve immunity. This application note focuses on considerations for a CapSense system. For a greater insight into EFT and how it affects microcontrollers in general, see AN80994.
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