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AN80994 - Design Considerations for Electrical Fast Transient (EFT) Immunity | Cypress Semiconductor

AN80994 - Design Considerations for Electrical Fast Transient (EFT) Immunity

Last Updated: 
Jul 25, 2017
Version: 
*H

AN80994 describes best practices for improving electrical fast transient (EFT) immunity in embedded system designs. 

Introduction

This application note discusses the effects of electrical fast transients (EFT) on embedded controllers and recommends hardware and firmware techniques to mitigate them. This application note also explains a set of guidelines that a designer can use to build a system that is immune to such transients.

If you are new to PSoC, refer to the following documents to learn about the device and the available tools:

Translated documents are for reference only. We recommend that you refer to the English-language version of a document if you are engaged in development of a design.