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AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | Cypress Semiconductor

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

Last Updated: 
Jul 20, 2017
Version: 
*D

This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.

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