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AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

Last Updated: 11/02/2012
Version: *A



This application note describes the accelerated neutron testing procedure and test conditions, which are applied during device qualification for Cypress SRAM devices. This application note covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM as well as Nonvolatile SRAM (nvSRAM). This Application note does not contain the SER data for any of the SRAMs. The derived accelerated Neutron failure rates are listed in the individual data sheets for Synchronous SRAMs. For other families, SER data can be availed by raising a request on Cypress’ customer care portal.

这些文档仅供参考。赛普拉斯、赛普拉斯管理层、雇员及分销商对翻译错误不承担任何责任。当您在设计开发过程中使用这些文档时,我们强烈建议您参照英文版本。

これらの文献はあくまでもご参考のためのみに日本語翻訳されています。誤訳によるトラブルが発生した場合、Cypress Semiconductor Corp. 全ての子会社、関連会社、役員、従業員、販売代理店は一切の責任を負いかねます。 最新の英語版オリジナル文献を必ずご参照いただくことをお勧め致します。




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      AN54908.pdf English 245 KB 09/14/2012
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Spec No: 001-54908; Sunset Owner: NYBP; Secondary Owner: LKZ; Sunset Date: 10/15/11

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