Improving the Accuracy and Efficiency of Junction Capacitance Characterization
Last Updated: 11/13/2008
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| Strategies for Probing Configuration and Data Set Size |
In this paper, the on-wafer measurement of junction depletion capacitance is examined. This work provides an in-depth discussion of possible probing configurations which can be used. It outlines a method to consistently measure the junction capacitances accurately. The results from this method compare favorably with those extracted using S-parameter measurements. Additionally, methods are formulated to reduce the number of data points required for parameter extraction while at the same time maintaining a high model accuracy.
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Spec No: None;
Sunset Owner: OBS;
Secondary Owner: DSP;
Sunset Date: 08/07/11
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