AN15979 - Soft Errors in nvSRAM
Last Updated: 07/26/2012
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Version: *C
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| AN15979 describes the soft error causes in the memories and how nvSRAM-architecture features and packaging techniques act to reduce soft errors. |
Introduction
The Soft Error Rate (SER) of advanced CMOS devices is higher than all other reliability mechanisms combined together. So it becomes necessary for the high-speed memory architectures to counter the effect of soft errors. The Cypress nvSRAM with its unique architecture and special features such as Software STORE and Software RECALL can correct soft errors on the fly. This capability combined with Cypress’s intense SER test methodology makes nvSRAM one of the most reliable memory devices against the soft errors.
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Related Application Notes:
Domain Tags: Memory Type, Non Volatile Memories
Related Knowledge Base: nvSRAM, SER, RECALL, Async, Qualification Reports, Technology
Spec No: 001-15979;
Sunset Owner: ZSK;
Secondary Owner: PSR;
Sunset Date: 09/22/11
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